Santec TSL-570 Tunable Laser
The Santec TSL-570 is a tunable laser with a high signal-to-noise ratio (90 dB/0.1 nm) and a maximum optical output power of +13 dBm. It is used for tuning highly coherent laser radiation and can cover the tuning range of several tens of nanometers in the near-infrared region (relative to central wavelength of 1550 nm).
Applications
Spectroscopy, spectral analysis, fiber-optic sensors, frequency-domain optical reflectometry
Anritsu MS9740B Optical Spectrum Analyzer
The Anritsu MS9740B optical spectrum analyzer is a high-performance device that features a wide dynamic range, high sweep rate over a wavelength range of 600nm to 1750 nm, and high resolution. The device supports measurements with high optical sensitivity and high sweep frequency on multimode optical fibers. It can measure center wavelength, OSNR, bandwidth, etc. simultaneously, and display the results on one screen.
Applications
Electronics, materials science, mechanical engineering, medicine, metallography, criminalistics.
Luna OBR 4600 Optical Reflectometer
The Luna OBR 4600 optical reflectometer is an ultra-high-resolution device that delivers reflectometry with backscatter-level sensitivity. It enables distributed strain and temperature measurements on optical fibers up to 70 meters long with a spatial resolution up to 1 mm.
Applications
Frequency-domain optical reflectometry, mechanical condition monitoring, fiber optic sensors.
Hirox KH-7700 Digital Optical 3D Microscope
The device is an optical inspection instrument with a zoom system allowing for fast and continuously variable magnification by 7000 times. It is used for digital imaging of objects in polarized light at variable illumination angles, differential interference contrast, and can make high-precision three-coordinate measurements and create accurate 3D reconstructions.
Applications
Electronics, materials science, mechanical engineering, medicine, metallography, criminalistics.
Atomic force microscope Ntegra Prima
The Ntegra Prima Atomic Force Microscope is a versatile, multifunctional scanning probe microscope (SPM) that is used for high-resolution investigation of surface and subsurface properties of materials at micro- and nano-scales.
Applications
Materials science problems: 3D relief structure at the micro- and nano-scale, surface phase composition, mapping of electrical conductivity and local magnetic inhomogeneities, physical and mechanical properties of the surface, tunnel electron microscopy.
MIM-N Laser Microscope
The MIM-N is a laser interferential microscope operating in a transmitted light and intended for 3D analysis of the optical length difference between microscopic objects. It is equipped with a channel allowing for the fluorescence image registration. The device is used to create graphic images and to perform their digital analysis to obtain high-precision data on the linear dimensions of an object.
Applications
Fundamental and applied research in biology and medicine.
Krüss K100 Processor Tensiometer
The Krüss K100 Processor Tensiometer is used for automated measurements of liquid and solid properties, including surface and interfacial tension, isotherm and CMC of surfactants, contact angle and surface free energy of solid samples, films, powders, and fibers.
Applications
Development of surfactants and investigation of their properties, formulation of new composites, paint and varnish industry, oil refining industry, food industry.
Krüss BP100 Tensiometer
The automatic BP100 is a hardware and software system for measuring dynamic surface tension using the maximum bubble pressure method at a surface age ranging from 5 ms to 200 s. It can calculate the equilibrium surface tension using the Hua–Rosen equation, as well as the diffusion and adsorption coefficients.
Applications
Study of surfactants and foams, optimization of spraying and coating processes
Krüss DSA30S Drop Shape Analyzer
The DSA3OS Drop Shape Analyzer is designed for the semi-automatic measurement of the static and dynamic contact angle and free surface energy. The device is equipped with a module for studying the surface rheology of adsorbed surfactant layers.
Applications
Study of adhesion and stability of adhesive and paint- and- varnish coatings, analysis of wettability of different materials, control of surface treatment.
Photocor Compact Particle Size Analyzer
Photocor Compact is a device for particle size measurements by the dynamic light scattering method in the particle size range from 0.5 nm to 10 µm. Particle size measurements in opaque dispersions are available in back-scattering mode. The device conforms to the international standards for particle size measurements ISO 22412:2008.
Applications
Investigation of particle size distribution of disperse media based on liquid carriers.
POLIS Velocity Field Registration System
The system is designed to analyze three-dimensional velocity fields in liquids and gases. The measurements are performed using four recording cameras and a laser system or LED light source to illuminate the flow. The resulting images are processed by applying the tomographic PIV (Tomo PIV) technique.
Applications
Investigation of complex three-dimensional flow structures in transparent media.
DOP 5000 Ultrasonic Doppler Anemometer
The device is used to measure instantaneous flow velocity profiles of transparent and opaque liquids and echo profiles using an ensemble of velocity sensors.
Applications
Investigation of the flow velocity and magneto-hydrodynamic processes in liquid metals at room temperature, and the evolution of the liquid-solid interface during directional crystallization.
SIOS LSV 2-2500 Laser Vibrometer
The apparatus is designed for precise synchronous non-contact measurement of vibration parameters at two points using laser interferometry. It allows measuring oscillations with the amplitude of ± 20 mm in the frequency range from 0 to 5 MHz, at the resolution of 5 pm and maximum velocity amplitude of 3 m/s.
Applications
High-precision oscillation measurements on different surfaces with non-uniform microscopic textures.
SkyScan 1272 Bruker X-ray Tomograph
The SkyScan 1272 is the innovative high-resolution X-ray microtomograph equipment used for scanning the microstructure of samples from natural and structural materials with a spatial resolution up to 0.5 microns It enables the creation of 3D representations and integrated data processing allowing for visualization of the internal material structure, construction of its digital model, and performance of statistical and morphological analysis of cracks, pores, inclusions, etc.
Applications
Materials science, geology, engineering.
FASTCAM SA-Z type 2100K High Speed Camera
The ultra-high speed FASTCAM SA-Z camera provides a means of capturing high resolution digital images of previously invisible high-speed processes and events at the frame rates up to 2,100,000 frames per second. The shutter speed as short as 159 nanoseconds makes it possible to avoid image blurring. Together with the software for digital image correlation, this allows measuring the displacement and deformation fields during dynamic tests.
Applications
Dynamic testing of standard samples and structurally similar components.
Zygo New-View 5000 Interference Microscope
The Zygo NewView 5000 is a non-contact optical 3D profiler. It uses scanning white light interferometry to construct profiles and 3D images of surfaces with accuracy up to 1 nm. The instrument is also used to assess the quality of surface treatment, to visualize surface defects and deformation marks and to perform quantitative phase profilometry.
Applications
Materials science, mechanical engineering, electronics, metallography.
Shimadzu USF-2000 Ultrasonic Testing Machine
The system is designed to conduct fatigue testing of metal and alloy specimens in a resonant mode at a 20 kHz load frequency, which makes it possible to achieve specimen’s baseline at 10–10 load cycles in a few days. A characteristic feature of the specimen during these tests is crack formation inside the material rather than on its surface.
Applications
Materials science, mechanical engineering, aircraft engine building
Shimadzu AG-X Plus 300 KN Testing Machine
This machine is designed for mechanical testing of a wide class of materials (metals, composites, and rocks) in tension, compression, and three-point and four-point bending in a temperature range from –70 to +200°C. The maximum gripping force is 300 kN. Strain monitoring and measurement is performed using a video extensometer.
Applications
Mechanical testing of samples and structurally similar elements.